Study of structural parameter variation and chemical analysis of II-VI solid solution of CdSxSe1-x thin films by spray pyrolysis

ABSTRACT CdSxSe1-x thin films prepared at 3500C by using aqueous solution of cadmium chloride, thiourea and selenium dioxide 0.02 M. The X-ray study shows a hexagonal structure throughout the composition parameter x (0.00, 0.25, 0.50, 0.75,1.0) with preferred orientation along (100) direction. The lattice parameter value of ‘a' and ‘c' follows the Vegards law. Absence of back reflection and clear fundamental reflection observed in the pattern indicates the disorder structures which are common in sulfide and selenied.