On the low temperature resistivity measurement of CdSe thin film Download
Journal: International Journal of Trend in Scientific Research and Development (Vol.1, No. 2)Publication Date: 2017-02-14
Authors : R.K.Shah; H.O.Parmar; H.S.Patel;
Page : 28-30
Keywords : Cadmium Selenide; thermal evaporation technique; thin film; electrical resistivity;
Abstract
Most group II-VI compounds are direct band gap semiconductors with high optical absorption and emission coefficients .Cadmium Selenide is a leading candidate with high potential towards many applications. The authors present their investigations dealing with preparation and some electrical characterization of the CdSe thin films. The films were deposited onto a well-cleaned glass substrates using thermal evaporation technique. The dependence of electrical resistivity of CdSe thin film in low temperature range has been studied.
R.K.Shah | H.O.Parmar | H.S.Patel "On the low temperature resistivity measurement of CdSe thin film" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-1 | Issue-2 , February 2017, URL: http://www.ijtsrd.com/papers/ijtsrd65.pdf
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Last modified: 2017-04-22 00:12:08