Structural Properties of (SnO2)1-x(ZnO)xThin Films Deposited By Spray Pyrolysis Technique

Nano structure of mixed (SnO2)1-x(ZnO)x thin films were prepared by spray pyrolysis technique at a substrate temperature of 400°C. The films deposited were 190 nm thickness. The XRD analysis for its structural characteristic has been performed. The average grain size was found to be between 21.27 and 15.80 nm.AFM Atomic Force microscope gives good information about the surface topography of the film.It is understood that the crystallinity of SnO2increases with increasing ZnO Vol.%.