GROWTH, STRUCTURAL AND MECHANICAL STUDIES OF THIOUREA PHTHALIC ACID (TPA) SINGLE CRYSTALS BY X-RAY POWDER DIFFRACTION AND VICKER’S MICROHARDNESS TESTING
Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.6, No. 7)Publication Date: 2017-07-30
Authors : M. Suresh Kumar; S. Krishnan; G.V. Vijayaraghavan;
Page : 820-826
Keywords : X-Ray Powder diffraction; Yield strength and Stiffness constant.;
Abstract
Good quality Thiourea Phthalic acid (TPA) single crystals were grown by slow evaporation solution growth technique at room temperature. X-Ray powder diffraction and Mechanical characterizations of slow evaporation grown single crystals of Thiourea-Phthalic acid (TPA) are analyzed in this article. Mechanical properties such as Vicker's microhardness number, work hardening index, standard hardness value, Yield strength, fracture toughness, brittleness index, and elastic Stiffness constant values are determined using Vicker's microhardness tester.
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Last modified: 2017-07-31 20:20:15