ResearchBib Share Your Research, Maximize Your Social Impacts
Sign for Notice Everyday Sign up >> Login

GROWTH, STRUCTURAL AND MECHANICAL STUDIES OF THIOUREA PHTHALIC ACID (TPA) SINGLE CRYSTALS BY X-RAY POWDER DIFFRACTION AND VICKER’S MICROHARDNESS TESTING

Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.6, No. 7)

Publication Date:

Authors : ; ; ;

Page : 820-826

Keywords : X-Ray Powder diffraction; Yield strength and Stiffness constant.;

Source : Downloadexternal Find it from : Google Scholarexternal

Abstract

Good quality Thiourea Phthalic acid (TPA) single crystals were grown by slow evaporation solution growth technique at room temperature. X-Ray powder diffraction and Mechanical characterizations of slow evaporation grown single crystals of Thiourea-Phthalic acid (TPA) are analyzed in this article. Mechanical properties such as Vicker's microhardness number, work hardening index, standard hardness value, Yield strength, fracture toughness, brittleness index, and elastic Stiffness constant values are determined using Vicker's microhardness tester.

Last modified: 2017-07-31 20:20:15