EUCLIDEAN GEMETRY LDPC CODES FOR ERROR CORRECTION AND ERROR DETECTION IN MEMORY APPLICATION?

Most of the Memory cells have been protected from soft errors for more than a decade; due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected .This project propose a new approach to design faultsecure encoder and decoder circuitry for memory designs. The key novel contribution of this project is identifying and defining a new class of error-correcting codes whose redundancy makes the design of fault-secure detectors (FSD) particularly simple. In this project, a fault-tolerant nano-memory architecture is implemented which tolerates transient faults both in the storage unit and in the supporting logic (i.e., encoder, decoder (corrector), and detector circuitries).In this project, the Euclidean Geometry low density parity check (EG LDPC) codes have the fault-secure detector capability will be proved. Using some of the smaller EG-LDPC codes, we can tolerate bit or nanowire defect rates of 10% and fault rates of 10-18 upsets/device/cycle; a unified approach is presented to tolerate permanent defects and transient faults. This unified approach reduces the area overhead.