ANALOG TESTING METHODOLOGIES-A SURVEY

Analog circuit testing is considered to be a very complex task, primarily to the lack of fault models and accessibility to internal nodes. Conventionally, work on analog testing has focused on analysis of faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and a fault free circuit has become a big challenge. The complexity of today's analog circuits and their many parameters, as well as the restricted accessibility to their internal modules, restricts the use of conventional automatic test equipment. Such equipment does not have enough storage and lacks the capability of computation during actual testing. Various papers have proposed different techniques to reduce the burden of testing analog circuits. This survey attempts to outline some of the work, providing different methodologies used to test an Analog circuit