Fault Analysis Using Stft and Travelling Wave Method
Journal: International Journal of Trend in Scientific Research and Development (Vol.2, No. 3)Publication Date: 2018-08-02
Authors : Rajesh Saini Deepika Chauhan Brijraj Singh;
Page : 1241-1246
Keywords : Short Time Fourier Transform; Transmission Line; EMTP; Fault Detection and Classification;
Abstract
Current power supplies must give dependable, fantastic power. In this manner, it is vital that a transmission line blame be recognized precisely, dependably and rectified at the earliest opportunity. A strategy for arranging flaw compose in view of brief time Fourier change (STFT) is given in this paper. STFT is a methods for flag preparing in which a Fourier change (FT) is performed by setting a window work with a consistent size. This change is utilized to break down drifters in the power framework. This paper breaks down qualities of STFT by utilizing reproduction comes about because of MATLAB and characterizes line blames by blame kind. Precise and quick acknowledgment of transmission line blame area is of incredible criticalness to control framework security. Keeping in mind the end goal to settle the T compose transmission line blame area issue, the wave mode change and wavelet change are utilized to get the wavelet modulus maxima, and after that decide line overvoltage wave entry time, finally figure the blame area as per the blame area equation. This paper depicted the guideline of transmission line blame area in light of voyaging waves. The vulnerability of wave speed conveys blunder to blame area in light of voyaging waves. The main heartbeat wave of blame likewise gives numerous trademark data of the disappointment which was utilized to distinguish the sort of disappointments to advantageous the laborers making focused on surge repair. Rajesh Saini | Dr. Deepika Chauhan | Mr. Brijraj Singh"Fault Analysis Using Stft and Travelling Wave Method" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-2 | Issue-3 , April 2018, URL: http://www.ijtsrd.com/papers/ijtsrd11277.pdf http://www.ijtsrd.com/engineering/electrical-engineering/11277/fault-analysis-using-stft-and-travelling-wave-method/rajesh-saini
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Last modified: 2018-08-03 16:04:21