A Review on Finite Element Analysis of Free Fall Drop Test on Mobile Phone
Journal: International Journal of Science and Research (IJSR) (Vol.3, No. 6)Publication Date: 2014-06-15
Authors : Gurjinder Singh; Jaswinder Singh;
Page : 343-345
Keywords : : Finite Element Analysis; LS ? Dyna; Product & Broad Level; Explicit vs. Implicit.;
Abstract
: Present paper discusses the working methodologies used for drop test. Engineers widely used physical testing method to investigate the behaviour of cellular phone during drop test. It is very costly, time consuming and complex. Finite element analysis provides numerical models without spent so much money on physical testing methods. Drop test simulation is one of the important tool uses for the impact behaviour study of cellular phones. It identifies weak design points during the impact behaviour of cellular phone.
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Last modified: 2014-06-23 15:33:03