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Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes

Journal: Iranian Chemical Communication (Vol.3, No. 3)

Publication Date:

Authors : ; ;

Page : 266-275

Keywords : Magnetic force microscope; dielectrophoresis; carbon nanotube probe; MFM probe;

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Abstract

Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope ( AFM ) tip was investigated . The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.

Last modified: 2019-06-26 14:10:07