The influence of the metal microstructure on the breakdown mechanism of Schottky diodes
Journal: Materials Physics and Chemistry (Vol.1, No. 1)Publication Date: 2019-01-13
Authors : Sh.G.Askerov M.G.Gasanov L.KAbdullayeva;
Page : 1-6
Keywords : Schottky diode; Metal-semiconductor contact; Interface; Barrier height; Breakdown voltage;
Abstract
In this paper, the influence of the microstructure of a metal on the breakdown mechanism of diodes with a Schottky barrier is studied. It is shown that in electronic processes occurring in the contact between a metal and a semiconductor, the metal plays a very active role and is a more important contact partner than a semiconductor. Unlike the known mechanisms of breakdown of diodes (avalanche, tunnel and thermal), another mechanism is proposed in this paper - the geometric mechanism of the reverse current flow of Schottky diodes made using a metal with a polycrystalline
structure. The polycrystallinity of a metal transforms a homogeneous contact into a complex system, which consists of parallel-connected multiple elementary contacts having different properties and parameters.
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