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Efficient Structure for Testing Operational Amplifiers

Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.2, No. 5)

Publication Date:

Authors : ; ;

Page : 1237-1239

Keywords : s: OA;

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Abstract

Rapid advances in application specific integrated circuits have posed a challenge in both design and test of analog components to provide consistent circuit performance. In this paper, a structure is proposed and designed that will help the ASIC industries in testing analog components. The Op-Amp under test is configured as voltage follower and the signature is analyzed using digital circuitry.

Last modified: 2014-10-18 18:36:52