A Study of Different SRAM Cell Designs
Journal: International Journal of Emerging Trends in Engineering Research (IJETER) (Vol.9, No. 3)Publication Date: 2021-03-05
Authors : Aparna Ram Chandra Singh Chauhan;
Page : 303-309
Keywords : Cell area; low power; MOS; SRAM Cell; SRAM stability.;
Abstract
Presently, huge advancements are being witnessed in the electronics sector like AR, AI, driverless cars, smart homes, portable devices like mobile phones, etc. that requires the improvement of memory technology for efficient working. Memory plays a major role in the present scenario of improvements and growth. Out of different forms of memory devices, the most popular and presently used type of form is the semiconductor MOS memory, specifically SRAM (Static Random-Access Memory) that plays a very important role in the microprocessor domain as it covers a large portion of the chip. But with the increased scale of integration, leakage power, leakage current, and delay becomes a problem in the designing of an SRAM cell. This paper is a review of SRAM cells that have been proposed in the past for achieving improvement in SRAM cell parameters like power consumption, delay, leakage current, read and write stability, better cell operations, etc.
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Last modified: 2021-03-08 19:54:24