Characterizing Standard Cells for Intra-Cell Variations

Standard cell characterization refers to the process of compiling data about the behavior of the cell. It is necessary to capture accurate values of delay, power and various other characteristics. As the technology is shrinking to satisfy the demand for faster, low-power chips, the impact of small variation in the circuit parameters is increasing exponentially. This variations did not have significant impact on the standard cells of higher nodes. But at lower nodes these have significant impact, which if not considered may lead to design failures. In this paper we discuss a method of characterization where we consider the variation on different parameters of the standard cells and the impact it has on the delay values.