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An Elemental Analysis of Different CD-R discs
Journal: Journal of Advances in Physics (Vol.5, No. 1)Publication Date: 2014-07-17
Authors : Amir Pishkoo;
Page : 752-756
Keywords : RBS technique; PIXE technique; CD-R disk; Label side (up); Record side (down);
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Abstract
In this study Proton Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) as reliable and non-destructive techniques has been applied to compare thickness, major and trace elements of different brands of CD-R discs. Three elements, namely Ag, Ba, and Ti were found to be the major elements.
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Last modified: 2015-01-16 19:01:05