A Survey Paper on F-SIFT for Object and Copy Detection
Journal: International Journal of Science and Research (IJSR) (Vol.3, No. 11)Publication Date: 2014-11-05
Authors : Tanvi Gadgi; Amrit Priyadarshi;
Page : 1155-1156
Keywords : Flip Invariant; Scale-invariant; symmetric pattern; normalization;
Abstract
Scale-invariant feature transform (SIFT) is succeed in such a way that it become very easy to extensively employ image local feature in different computers vision and image processing softwares. SIFT is very helpful to develop advance object classifiers. SIFT has been accepted widely for its invariant to scale, lighting and rotation in images. SIFT derived from sensitive gradient fields is not Flip Invariant.
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