Estimation of Correlation Coefficients and Path for Yield Traits in Grain Mold Tolerant F3 Progenies of Sorghum

Study comprised of F3 generation sorghum material obtained from eight resistant susceptible crosses along with respective parents and popular checks DSV 6 (resistant), 296 B (susceptible), was carried out with an objective to assess the nature of association between grain yield and its component traits and the direct and indirect effects on grain yield. Correlation studies revealed days to maturity at genotypic level and days to flowering at both genotypic and phenotypic levels showed highly significant negative correlation with grain yield. Negative correlation is desirable for these traits as less number of days to flower reduces the crop duration, this in turn is helpful in terms of economic cultivation of sorghum crop. At both phenotypic and genotypic levels, plant height exerted highly significant positive correlation with grain yield. Path analysis study in the present investigation revealed that, out of six characters, two characters viz. , days to flowering and plant height had positive direct effect on grain yield. While the character days to maturity showed high negative direct and indirect effect on grain yield and panicle length had non-significant association with grain yield, hence panicle length may not be useful as a criterion for selection for increased grain yield.