Genetic Variability, Correlation and Path Coefficient Analysis for Yield and it's Contributing Traits in Wheat [Triticum aestivum (L.)]

A field experiment was undertaken to analyze the genetic variability, correlation and path coefficient analysis of yield and its contributing traits in ten wheat genotypes grown at the farm, of B. N. P. G. College, Rath, Hamirpur, (U. P. ), during Rabi season of 2012-13. Analysis of variance revealed highly significant differences among the genotypes for yield and its contributing components. Wide genetic variability was observed among genotypes for days to 50 % flowering, plant height (cm. ), length of ear (cm), number of spikelets per ear, days to maturity, number of seed per ear, test weight (g) and grain yield per plant. Phenotypic variances were higher than the genotypic variances. High heritability with low genetic advance in percent of mean was observed for days to maturity which indicated the involvement of non-additive gene action for the expression of this character and selection for such trait might not be rewarding. High heritability coupled with high genetic advance in percent of mean was observed for days to 50 % flowering, indicating that this traits were under additive gene control and selection for genetic improvement for this traits would be effective. Yield per plant had high positive and significant correlation with number of tillers per plant, number of seed per ear and test weight (g). Path coefficient analysis revealed maximum direct contribution towards yield per plant with length of ear followed by test weight (g). Hence, emphasis should be given to select these traits to increase the production and productivity of wheat.