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Barrier Height and Changing Insulator Thickness of Thin Film MIS Junctions

Journal: International Journal of Science and Research (IJSR) (Vol.4, No. 9)

Publication Date:

Authors : ;

Page : 1986-1989

Keywords : THIN FILM MIS JUNCTIONS;

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Abstract

Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined that barrier height () increases as the thickness of the insulator increases.

Last modified: 2021-06-30 21:53:24