Barrier Height and Changing Insulator Thickness of Thin Film MIS Junctions
Journal: International Journal of Science and Research (IJSR) (Vol.4, No. 9)Publication Date: 2015-09-05
Authors : Jassim Mohammed Salih Al-fahdawi;
Page : 1986-1989
Keywords : THIN FILM MIS JUNCTIONS;
Abstract
Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined that barrier height () increases as the thickness of the insulator increases.
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