Realization of Programmable PRPG with Enhanced Fault Coverage Gradient
Journal: International Journal of Science and Research (IJSR) (Vol.5, No. 5)Publication Date: 2016-05-05
Authors : Lakshmi Asokan; Jeena Maria Cherian;
Page : 2286-2288
Keywords : BIST; low power test; PRPG; test data volume compression;
Abstract
This paper describes a low power programmable pseudorandom pattern generator with desired toggling level and also enhanced fault coverage compared with other BIST based on PRPG. It comprised of finite state machine LFSR driving a phase shifter and it allows the device to produce binary sequence with preselected toggling activity. Generator is automatically controlled providing easy and precise tuning. Furthermore, this paper introduces a test compression method to avoid repeated pattern generation for testing the same device. The main highlight of this paper is to reduce the test data volume and test data memory.
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