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Realization of Programmable PRPG with Enhanced Fault Coverage Gradient

Journal: International Journal of Science and Research (IJSR) (Vol.5, No. 5)

Publication Date:

Authors : ; ;

Page : 2286-2288

Keywords : BIST; low power test; PRPG; test data volume compression;

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Abstract

This paper describes a low power programmable pseudorandom pattern generator with desired toggling level and also enhanced fault coverage compared with other BIST based on PRPG. It comprised of finite state machine LFSR driving a phase shifter and it allows the device to produce binary sequence with preselected toggling activity. Generator is automatically controlled providing easy and precise tuning. Furthermore, this paper introduces a test compression method to avoid repeated pattern generation for testing the same device. The main highlight of this paper is to reduce the test data volume and test data memory.

Last modified: 2021-07-01 14:37:34