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Overview of HVEM Investigations in Materials Science

Journal: Journal of Analytical Science and Technology (JAST) (Vol.2, No. 3)

Publication Date:

Authors : ;

Page : A1-A7

Keywords : HVEM; point defect; dislocation loop; implantation;

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Abstract

High-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed.

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Last modified: 2012-11-07 23:18:15