Nano Scale Surface Characterization of Poly Ethyleneterephthalate Silicon Rubber Copolymers using Atomic Force Microscopy

Atomic force microscopy has been used to investigated the surface properties of different materials, in this paper it is used to measure the surface roughness and surface adhesive force of three different membrane samples Poly ethyleneterephthalate PET , Silicon Rubber SR and PET SRcopolymers. This analytical method allows images representing the topography and adhesive force Phase image of the surface to be captured simultaneously at a molecular nanometer resolution. The distribution of hydrophilic polar groups and the surface roughness on the investigated surfaces ofthese membrane samples influences the subsequent processing of polymeric membrane manufacture as well as their performance. From the results a clear distinction was observed between the three samples in both images the topography surface roughness images and adhesive force images. Promising result were obtained for the PET SRcopolymer samples to be a good candidate in membrane separation applications. This study may also help to explain the differences in membrane performances and efficiency during applications in the separation process. Dr. Abduelmaged Abduallah | Dr. Kamal M. Sassi | Dr. Mustafa T. Yagub "Nano-Scale Surface Characterization of Poly (Ethyleneterephthalate) - Silicon Rubber Copolymers using Atomic Force Microscopy" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-5 | Issue-4 , June 2021, URL: https://www.ijtsrd.compapers/ijtsrd43688.pdf Paper URL: https://www.ijtsrd.comengineering/chemical-engineering/43688/nanoscale-surface-characterization-of-poly--ethyleneterephthalate--silicon-rubber-copolymers-using-atomic-force-microscopy/dr-abduelmaged-abduallah