NEXT GENERATION SMART MUTATION TESTING FOR JAVA
Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.4, No. 10)Publication Date: 2015-10-30
Authors : V. M. Lomte; Mitesh Rampariya; Barkha Sethia; Vishakha Navandar; Lubdha Dahale;
Page : 409-415
Keywords : Mutation testing; Cost of bugs; Quality of test cases; Mutation score; early detection;
Abstract
Software testing is a very time consuming process of software development life cycle. The software tester has to think a lot before he generates any test cases. Even after generating the test cases there is no proof that those test cases can actually uncover all the bugs and there is no guarantee of code coverage. The cost of bug also increases drastically as the software is being developed. Hence this paper tries to reduce the stress of testers as well as reduce the cost of bugs by early detection of bugs by implementing mutation testing strategy with new mutation operators introduces in this paper. This will evaluate the quality of test cases and the tester can modify his test cases based on the mutation score generated in order to improve his test cases
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Last modified: 2015-10-17 21:12:49