A Study on TE Scattering by a Conductive Strip Grating Over Grounded Two Dielectric Layers
Journal: The Journal of the Institute of Internet, Broadcasting and Communication (Vol.15, No. 2)Publication Date: 2015-04-30
Authors : Uei-Joong Yoon;
Page : 65-70
Keywords : TE scattering; Conductive boundary condition; Point matching and Fourier galerkin moment method;
Abstract
In this paper, the solutions of TE (transverse electric) scattering problems by a conductive strip grating over grounded two dielectric layers are analyzed by applying the PMM (point matching method) known as a numerical method of electromagnetic filed. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permitting and thickness of the two dielectric layers, and incident angles. The numerical results of present numeric analysis are shown in good agreement compared to those of the existing papers using FGMM (Fourier Galerkin moment method).
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Last modified: 2015-11-19 15:16:25