FAULT DIAGNOSIS OF SUBTHRESHOLD LEAKAGE CURRENT DEFECTS IN DRAM
Journal: International Journal OF Engineering Sciences & Management Research (Vol.3, No. 1)Publication Date: 2016-01-30
Authors : K. Manju Priya; S.Malini;
Page : 131-139
Keywords : Functional Fault Models (FFM); Address decoder Fault (AF); Stuck;
Abstract
The minimum feature size of dynamic RAM has been down - scaled, so several studies have been carried out to determine ways to protect cell data from leakage current in many areas. Due to leakage sources, permanent error occurs. Many permanent faults are a result of manufacturing defects, which can be detected during manufacture testing. These errors can also occur at runtime. A self - contained adaptive system for detecting and bypassing permanent errors in on - chip interconnects is proposed. This system reroutes data on erroneous links to a set of spare wires without interrupting the data flow .
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Last modified: 2016-01-07 16:50:44