DEFECT ANALYSIS OF QUANTUM-DOT CELLULAR AUTOMATA COMBINATIONAL CIRCUIT USING HDLQ

CMOS technology has achieved the device dimension in the nanometer range. Beyond this CMOS technology is the QCA (Quantum-dot Cellular Automata). Due to nanoscale defects may occur in this technology so in the consequences of it the faults will occur. This paper presents the defect analysis of QCA basic devices like Majority Voter (MV), inverter. The defect analysis and its effects on the output of combinational circuit using Hardware Description Language for QCA (HDLQ) is presented in this paper.