An Investigation to Displacing and Broadening of XRD Peaks Induced by Mechanical Stress in Cu and Mg

ABSTRACT Applied external stress on the crystalline materials cause on the microstructure defects and/or variation of their lattice constanst,which in turn leads to change the x-ray diffraction parameters.For istance a little change in the diffraction angle could be seen in a precise XRD study.In this work the effects of different amounts of applied stresses on the diffraction angles and broadening of the XRD diffraction peaks with respect to the non-stressed samples have been studied. Overall results of two different structure samples,Cu&Mg, show the increase of diffraction angles and broadening the relevant peaks in accordance to the applied stress on the both samples.