ResearchBib Share Your Research, Maximize Your Social Impacts
Sign for Notice Everyday Sign up >> Login

An Analysis of Noble 12T SRAM cell with different performance parameter at 32 NM Technology

Journal: International Journal of Application or Innovation in Engineering & Management (IJAIEM) (Vol.5, No. 10)

Publication Date:

Authors : ; ; ;

Page : 138-144

Keywords : Leakage power; Read delay; ION/IOFF; Schmitt trigger;

Source : Downloadexternal Find it from : Google Scholarexternal

Abstract

ABSTRACT Leakage power dissipation, read delay, write delay and ION/IOFF are initial parameters which are practically positive in low power applications. Now a day's low power applications are valuable in semiconductor devices. This paper presents a noble 12T SRAM cell where we use Schmitt trigger circuit and conventional transistor to augment cell performance. Firstly we analysis proposed 12T SRAM cell with conventional 6T, 9T, 10T and 11T SRAM cell in different parameters and compares them in 0.9 volt at 32nm technology. Results are enhanced inread delay, ION/IOFF, leakage current and power dissipation.

Last modified: 2016-11-14 19:37:32