An Analysis of Noble 12T SRAM cell with different performance parameter at 32 NM Technology
Journal: International Journal of Application or Innovation in Engineering & Management (IJAIEM) (Vol.5, No. 10)Publication Date: 2016-11-14
Authors : Garima Upadhyay; Amit Singh Rajput; Nikhil Saxena;
Page : 138-144
Keywords : Leakage power; Read delay; ION/IOFF; Schmitt trigger;
Abstract
ABSTRACT Leakage power dissipation, read delay, write delay and ION/IOFF are initial parameters which are practically positive in low power applications. Now a day's low power applications are valuable in semiconductor devices. This paper presents a noble 12T SRAM cell where we use Schmitt trigger circuit and conventional transistor to augment cell performance. Firstly we analysis proposed 12T SRAM cell with conventional 6T, 9T, 10T and 11T SRAM cell in different parameters and compares them in 0.9 volt at 32nm technology. Results are enhanced inread delay, ION/IOFF, leakage current and power dissipation.
Other Latest Articles
- SHREDDING EFFICIENCY OF AGRICULTURAL CROP SHREDDER AS INFLUENCED BY FORWARD SPEED OF OPERATION, NUMBER OF BLADES AND PERIPHERAL VELOCITY
- Short Message Service based Water level monitoring for DAMS using Global System for Mobile Communication
- A STUDY ON PROBLEMS AND PROSPECTS OF WOMEN FISH VENDORS IN RAMANTHURAI
- PERFORMANCE COMPARATIVE ANALYSIS OF IMPROVED FUZZY AND NON-FUZZY CLASSIFICATION METHODS
- INTERNET OF THINGS: OBSTACLES AND CHALLENGES
Last modified: 2016-11-14 19:37:32