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Journal: International Journal of Scientific Research and Management Studies (Vol.1, No. 1)

Publication Date:

Authors : ; ;

Page : 33-41

Keywords : Fault tolerance; ILT; SSD; Genome; stem cell; work cell; ijsrms;

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Fault tolerance (F-T) was an important issue in electronic device. However, such system was still impractical in many cases, particularly due to the complex rerouting process that follows cell replacement. In this project, proposed a dynamic reconfiguration capabilities system, therefore, a faulty module could be replaced and the whole system's functions and connections were maintained by simply assigning the same encoded data to a spare (stem) module. The proposed system reroutes data flow. To detect permanent errors at runtime, a novel in-line test (ILT) method using spare wires and a test pattern generator wass proposed. In addition, an improved syndrome storing-based detection (SSD) method was presented. In the presence of permanent errors, the probability of correct transmission in the proposed systems was improved by up to 140% over the standalone hamming code. Furthermore, this method achieves up to 38% area, 64% energy, and 61% latency improvements.

Last modified: 2017-04-13 22:47:03