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Synthesis and Characterization of Nanostructured (CdS)0.8Te0.2 Thin Films for Solar Cell Application.

Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.3, No. 4)

Publication Date:

Authors : ; ;

Page : 7012-7015

Keywords : Vacuum Evaporation; XRD; SEM; UV-VIS..;

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Tellurium doped Cadmium Sulfide thin films were deposited by vacuum evaporation onto rotating amorphous glass substrates at pressure of 10-5 torr. The crystal structure, surface morphology, elemental analysis and optical properties of the deposited films were studied with help of X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and UV-VIS Spectrophotometer. X-Ray diffraction analysis reveals that the deposited films have orthorhombic structure and polycrystalline in nature. The crystalline size (d) and dislocation density (δ) were determined and found to be 28.1nm and 1.266 x 1015 lines / cm2 respectively. SEM revels that the films are homogeneous having dense morphology. The optical band gap was determined by absorption spectra and found to be 2 to 2.17 eV.

Last modified: 2014-05-13 19:00:45