Development and Testing of Electronic Architecture for Networked ECUs Using Diagnosis Fault SystemJournal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.2, No. 6)
Publication Date: 2013-06-30
Authors : Rahul B. Adsul; Deepali A. Dekate;
Page : 1405-1421
Keywords : Electronic Architecture; ECU Development; ECU Modeling; Networked ECUs; ECU Testing.;
The progressive increase in number of components and electronic system demands the overall architecture to be developed in different scenario .In order to achieve optimum electronic systems, it is necessary to build many real devices and evaluate the performance of systems. However, it is also becoming necessary to build virtual devices because of the increasingly complicated and large-scale systems. So the physical level, connecting between functional level and implementation level, should also be applied to virtual development. On the other hand, not only the functions, but also the safety designs need virtual technology to apply fault injection. With increasingly sophisticated ECU development technologies, static simulators can no longer work with requisite testing requirements, so dynamic simulators are preferred. This progression with dynamic simulator will discusses the overall architecture of the system and the design decisions are made to reduce system cost. This paper also discusses a concept and a powerful tool, which allows a wide range of automatic tests to be performed on networked ECUs. More precisely, it represents a complex system for connecting and testing all the networked ECUs in a modern vehicle. Basically, testing is a vital and on-going part of the product development process, especially in the development of automotive systems. Validation testing of vehicle electrical systems and their computation is difficult and thus, expanding with the growth of certain features. Thus, a key to reduce test costs in increasingly complex systems is to work with the ability of the requisite distribution process in order to make every testable component in simpler manner.
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