A Novel Adaptive Technique to Mitigate Radiation Effects on FPGAS

The radiation effects on electronic components is a major concern for devices used in space environment. The change in configuration bits due to radiation effects may cause permanent or short term failures to the electronic devices such as flipflops, memories etc. Various techniques are being used for mitigating soft errors. This paper surveys some of the techniques used for providing fault tolerance in fpga based systems. One technique namely temporal data sampling is discussed here. A multilevel (ML) Flash memory on-chip error correction system design based on the concept of trellis coded modulation (TCM) is conferred to provide fault tolerance. Flash memory's combination of nonvolatility and easy in-system updateability are key attributes driving its adoption into today's system designs. A integrated memory structure is used for non volatile storage of bitstreams. This integrated memory structure integrates the advantageous features of volatile and non volatile memory.