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METHOD OF INCREASING MEASUREMENT SENSITIVITY MICRORELIEF PERIODIC SURFASE
Journal: International Scientific Journal "Internauka" (Vol.2, No. 6)Publication Date: 2015-09-30
Authors : Noskov M. F.; Bukatov A. V.; Ovchinnikov S. S.;
Page : 95-97
Keywords : double-beam microinterferometer; nonlinear photo registration; reflective diffraction grating; the program Femtoscan.;
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Abstract
A method of increasing the sensitivity of measurements, based on nonlinear photographic interference pattern and process it using the program Femtoscan, measurement sensitivity.
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Last modified: 2015-11-05 04:56:03