ACCELERATED RESOURCE TEST OF POWER TRANSISTOR OF HF-INVERTERS OF SPECIAL APPLICATION

Development of a screening technique of potentially unserviceable power transistors allowing increasing reliability of high-frequency inverters requires carrying out of resource tests. From the point of view of research time, it is expedient to carry out the accelerated resource tests. The diagram and algorithm of the installation work of the accelerated resource tests of power transistors meeting the modern requirements is provided in this article. For the accelerating factor the increased temperature appears.