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STUDY THE STRUCTURAL AND OPTICAL PROPERTIES OF 10% MAGNESIUM DOPED ZINC OXIDE THIN FILMS

Journal: International Journal of Advanced Research in Engineering and Technology (IJARET) (Vol.9, No. 3)

Publication Date:

Authors : ;

Page : 147-153

Keywords : Bandgap; Mg:ZnO thin films; SILAR; X-ray line broadening; SEM.;

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Abstract

Pure and manganese-doped zinc oxide (Mn:ZnO) thin films were deposited on quartz substrate by successive ion layer adsorption and reaction (SILAR) technique. The film growth rate was found to increase linearly with number of dipping cycle. XRD, SEM and UV–visible spectra measurement were done to investigate the effect of Mg doping on the structural and optical properties of Mg:ZnO thin films. Structural characterization by X-ray diffraction shows that polycrystalline nature of the films. This properties increase with magnesium incorporation. Particle size evaluated using X-ray line broadening analysis. The particle size decreases with maganesium doping. The average particle size for pure ZnO is 19·78nm and it reduces to 16·76nm for 10%Mg-doped ZnO. The strong preferred c-axis orientation is lost due to magnesium (Mg) doping. Due to Mg doping the optical bandgap of the films increases. The value of fundamental absorption edge is 3·14 eV for pure ZnO and it increases to 3·42 eV for 10%Mg:ZnO.

Last modified: 2018-12-10 16:10:58