THE ANALYSIS OF STRUCTURE OF THE SURFACE OF COMPOSITE POLYIMIDE FILMS WITH SiO FILLER BY ATOMIC FORCE MICROSCOPY METHOD

Using the atomic force microscopy method the morphology of the surface polyimide films and Polyi- mide ? SiO Filler systems was investigated. On the surface of the specified polymeric systems the roughness of various scale representing globules of polymer and their compositions with filler particles are visualized. Changes of the surface of a polymeric composite material as a result of delivering into a matrix of a filler of finely-divided SiO are revealed. The images received in a phase contrast regime allowed to conclude that on the surface of a composite material there are larger structural units, than in polyimide.