Innovative Solution to Eliminate Sn Flakes Migration at Package Singulation on a QFN Sn Plated Stepped Cut Design
Journal: International Research Journal of Advanced Engineering and Science (Vol.4, No. 4)Publication Date: 2020-08-15
Authors : Alvin S. Soreda; Ernesto T. Antilano Jr.;
Page : 290-292
Keywords : Sn Flakes; QFN SN Plated; Package Singulation; Stepped Cut Design;
Abstract
Package Singulation partial cut process of a Quad Flat No Leads (QFN) Package is now well-known at semiconductor manufacturing to enhance the Automatic Optical Inspection (AOI) capability of a finished Integrated Circuit (IC) device when subjected into surface mount on its respective functionality board. To obtain device units with step cut side wall profile, a QFN package strip must underwent on two (2) package sawing processes; Partial cut -sawing and Full cut sawing process. Partial cut sawing of a QFN package strip aimed to perform target cut depth on the Lead frame (LF) only that defend on the customer requirements prior the full cut sawing. After completing the package Partial cut sawing, the package will now able to undergo on a Tin plating process to coat the LF exposed copper material on a QFN package strip prior the full sawing process. During Package Full sawing process, an optimized com
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Last modified: 2020-06-16 16:27:14