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Utilization of DVTS for Power Dissipation in Submicron Fabrication

Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.2, No. 12)

Publication Date:

Authors : ; ; ; ;

Page : 3430-3432

Keywords : Dynamic Voltage and Threshold Scaling (DVTS); Low Power Design;

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Abstract

Power dissipation is one of the critical design factors in microelectronics industry which opens lot of space for advance development in deep sub micron fabrication techniques for the devices. Low power design reduces cooling cost and increases reliability, especially for high density systems. Moreover, it reduces the weight and size of portable devices. In order to achieve the aim, static and dynamic component plays the main role in power dissipation of CMOS circuits. With the advent of new generations, power consumption of modern digital integrated circuits becomes a serious issue which is increasing continuously. To overcome this problem, a new idea has been proposed which reduces the consumption of power directly by controlling the supply voltage and body biasing, dynamically, and this can be done by DVTS scheme. Hence, Dynamic Voltage and Threshold scaling scheme preserves the leakage power during the active mode of the circuit.

Last modified: 2014-11-13 21:26:45