Optical Analysis of ZnO Thin Films by SILAR Method

Zinc oxide (ZnO) thin films were grown on glass substrate by the Successive Ionic Layer Adsorption and Reaction (SILAR) technique. The structural, morphological surface and optical properties of the films have been studied by using X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-VIS-spectrophotometer. Effects of experimental parameters on the structural and optical properties were discussed. The X ray diffraction analysis shows that the films are polycrystalline with zincite hexagonal structure. The study of surface morphology reveals that deposited ZnO films the film contains the grains in the form of flakes and further magnification the flakes can be viewed as flower like morphology. Obtained ZnO films exhibit a moderately high transmittance in visible band, and optical band gap of 3.2 eV which can be applicable for photovoltaic applications..