Study the Effect of Annealing Temperature and Thickness on the Structural, Optical Properties of the (CdTe) Thin Films

Thin films of CdTe were prepared in the thickness (500 and 1000 nm) on the glass substrate by vacuum evaporation technique at room temperature then put in different annealing temperatures (300, 373, 473, 573) K for one hour. From the study Structural properties of the thin films by the X - ray diffraction, we found polycrystalline nature and with a preferred orientation along [111] cubic and increasing density when increasing the annealing temperature and found the new peaks at the annealing temperature of (573) K for CdO. The Transmittance spectrum was recorded as a function of wavelength range (500-1100) nm. The energy gap increase when the increase thickness and annealing temperature.