A Novel Architecture for High Quality Random Number Generation based on Enhanced WELL Method

This paper presents an efficient architecture for high quality random number generation based on WELL method. This design is capable of achieving a throughput of one sample per cycle. The basic architecture for WELL random generator was based on Block RAM and register hybrid architecture which uses large number of resources on FPGA. The proposed work uses architecture based on Dual port RAM instead of Block RAM and it results in considerable reduction in power dissipation compared to the BRAM architecture. This proposed work also produces random numbers of high quality and non-repeating in nature. The comparison between both the architectures are made on the basis of the power rating estimated using Xilinx ISE tool.