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Robust flip-flop Redesign for Violation Minimization Considering Hot Carrier Injection (HCI) and Negative Bias Temperature Instability (NBTI)
Journal: Advances in Computer Science : an International Journal(ACSIJ) (Vol.4, No. 1)Publication Date: 2015-01-31
Authors : Naeun Zang; Juho Kim;
Page : 74-82
Keywords : CMOS; Reliability; Aging; NBTI; HCI; Flip-flop;
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Find it from : Google Scholar
Abstract
As the CMOS device becomes smaller, the process and aging variations become one of the major issues for circuit reliability and yield. Thus, a number of studies on the aging effects are currently underway. In this paper, we measure the setup/hold time and ...
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Last modified: 2015-02-01 18:06:42