XRD, TEM Techniques for Nano Crystalline Thin FilmsJournal: International Journal of Science and Research (IJSR) (Vol.3, No. 3)
Publication Date: 2014-03-15
Authors : Paresh V. Modh;
Page : 503-504
Keywords : Optical; chemical properties; cancer research; condenser lens; Brugg’s law;
There are number of techniques to analyze and characterize any material in nano particle. Thin films and bulk form. In the present work to determine the purity, stoichiometric composition, structural determination microscopy, to get particle size and shape, optical studies, thermal studies of nano particles and thin films. There are number of techniques such as EDAX (Energy Dispersive Analysis of X-ray) XRD (X-Ray diffretometer), TEM (Transmission Electron Microscopy), Ruman Spectroscopy, TGA (Thermogravimetric Analysis), UV-VIS-NIR Spectrometer.
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Last modified: 2014-04-02 02:12:06