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Single Electron Transistor based Hardware designing of Linear Block Coding Technique for Error Correction in Digital Communication System

Journal: International Journal of Engineering Sciences & Research Technology (IJESRT) (Vol.3, No. 6)

Publication Date:

Authors : ;

Page : 382-388

Keywords : Single Electron Transistor (SET); Single Electron Devices (SED); e-beam lithography; Linear Block Coding Technique; error correction technique; Digital Communication System.;

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An increasing success in e-beam lithography technique revolutionized low power consuming, high integration density next generation nano device built consumer electronics. This has inspired Researchers to design several nanoscale devices such as Single Electron Transistor (SET) made Single Electron Devices (SED) that can be included in near future in every sphere of life. One such unique approach of the Researchers is to introduce SED in Digital Communication System. The major challenge faced by the Researchers is the unintentional error that often occurs in the receiver side of any Digital Communication System. It is essential to detect the error and correct it simultaneously during transmission. Several solutions have been reported so far in numerous research journals regarding this. Among other popular error correction techniques, the method opted here is Linear Block Coding Technique for error correction because of its unique feature of time consuming and efficient error detection process. Here the approach is to design a Single Electron Device based model of this error correction technique so that to incorporate it in near future for low power consuming Digital Communication System

Last modified: 2014-07-04 20:08:20