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Efficient Hardware Utilization for Functional Broadside Test to Achieve High Fault Coverage

Journal: International Journal of Science and Research (IJSR) (Vol.3, No. 9)

Publication Date:

Authors : ; ;

Page : 1938-1943

Keywords : Built-in test generation; functional broadside tests; reachable states; transition faults;

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Functional broadside tests are two-pattern scan-based tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. On-chip test generation has the added advantage that it reduces test data volume and facilitates at-speed test application. This paper shows that on-chip generation of functional broadside tests can be done using simple hardware, and can achieve high transition fault coverage forte stable circuits. With the proposed on-chip test generation method, the circuit is used for generating reachable states during test application. This alleviates the need to compute reachable states off-line

Last modified: 2021-06-30 21:07:44