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VLSI Implementation for BIST Controller using Signed and Unsigned Multiplier
Journal: International Journal of Science and Research (IJSR) (Vol.4, No. 1)Publication Date: 2015-01-05
Authors : Dileep Kumar; Ghanshyam;
Page : 1226-1230
Keywords : BIST; MBE; LFSR; Baugh-wooley multiplier; Booth multiplier;
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Abstract
--This journal mainly depicts the design and implementation of BIST (Built- in-Self-Test) using signed and unsigned multiplier. Power efficient in VLSI circuits is increasing day by day as rising demand of smart phones& Laptops. The present Modified Boot
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Last modified: 2021-06-30 21:20:16