Diffraction Analysis of Multi-layered Grating Structures using Rigorous Equivalent Transmission-Line Theory

The eigenvalue problems involving the diffraction of waves by multi-layered grating configurations can be explained by rigorous modal expansion terms. Such a modal solution can be represented by equivalent transmission-line networks, which are generalized forms of simple conventional circuits. This approach brings considerable physical insight into the grating diffraction process of the fields everywhere. In particular, the transmission-line representation can serve as a template for computational algorithms that systematically evaluate dispersion properties, radiation effects and other optical characteristics that are not readily obtained by other methods. To illustrate the validity of the present rigorous approach, the previous research works are numerically confirmed and the results agree well each other.